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Silk. Electronic test method for defects and evenness of raw silk

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Description

Silk. Electronic test method for defects and evenness of raw silk1 Scope This International Standard specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers. This International Standard is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.

The interest of customers

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